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Renishaw adds surface-finish probe for Revo system
Renishaw has added a probe option for its Revo five-axis measurement system, which allows surface-finish inspection to be fully integrated within coordinate measuring machine (CMM) routines.
With a measurement capability of 6.3 to 0.05 micron Ra, the SFP1 surface-finish probe provides a 'single platform' that will eliminate the need for handheld sensors or the necessity to move parts to costly dedicated surface-finish measuring machines, reducing labour costs and inspection lead times.
CMM users will now be able to automatically switch between part scanning and surface-finish measurement, with analysis all contained in a single measurement report.
As a fully integrated option for the Revo five-axis measurement system, users of the SFP1 surface-finish probe will benefit from a range of features that will boost inspection speed and flexibility, according to the company.
The probe incorporates a C axis, which, combined with the infinite positioning capability of the Revo measuring head and a choice of stylus holders, allows the probe tip to be automatically orientated to any angle to suit the part, ensuring that high-quality surface data is acquired.
The SFP1 is supplied with two dedicated stylus holders, the SFS-1 straight stylus and SFS-2 cranked stylus, which are selected under full measurement program control using the Revo system's modular rack system (MRS).
This enables flexible access to component features combined with the consistency of a fully automated CNC methodology.
Calibration of the sensor is also automated and is carried out within a CMM software program.
A new surface-finish calibration artefact is mounted on the MRS and is measured using the SFP1 probe.
Software then adjusts parameters within the probe in accordance with the artefact's calibrated value.
A skidded probe type with a 2-micron (0.000079in) tip radius diamond stylus, the SFP1 surface-finish probe outputs Ra, RMS and raw data formats to the metrology application client software via Renishaw's UCCServer software using the I++ DME protocol.
The raw data can subsequently be presented to specialist surface analysis software packages for further detailed reporting.
http://www.manufacturingtalk.com/news/rea/rea507.html
With a measurement capability of 6.3 to 0.05 micron Ra, the SFP1 surface-finish probe provides a 'single platform' that will eliminate the need for handheld sensors or the necessity to move parts to costly dedicated surface-finish measuring machines, reducing labour costs and inspection lead times.
CMM users will now be able to automatically switch between part scanning and surface-finish measurement, with analysis all contained in a single measurement report.
As a fully integrated option for the Revo five-axis measurement system, users of the SFP1 surface-finish probe will benefit from a range of features that will boost inspection speed and flexibility, according to the company.
The probe incorporates a C axis, which, combined with the infinite positioning capability of the Revo measuring head and a choice of stylus holders, allows the probe tip to be automatically orientated to any angle to suit the part, ensuring that high-quality surface data is acquired.
The SFP1 is supplied with two dedicated stylus holders, the SFS-1 straight stylus and SFS-2 cranked stylus, which are selected under full measurement program control using the Revo system's modular rack system (MRS).
This enables flexible access to component features combined with the consistency of a fully automated CNC methodology.
Calibration of the sensor is also automated and is carried out within a CMM software program.
A new surface-finish calibration artefact is mounted on the MRS and is measured using the SFP1 probe.
Software then adjusts parameters within the probe in accordance with the artefact's calibrated value.
A skidded probe type with a 2-micron (0.000079in) tip radius diamond stylus, the SFP1 surface-finish probe outputs Ra, RMS and raw data formats to the metrology application client software via Renishaw's UCCServer software using the I++ DME protocol.
The raw data can subsequently be presented to specialist surface analysis software packages for further detailed reporting.
http://www.manufacturingtalk.com/news/rea/rea507.html
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